The simultaneous application of Thermogravimetry (TG) and Differential Scanning Calorimetry (DSC) to a single sample in an STA instrument yields more information than separate application in two different instruments:
- The test conditions are perfectly identical for the TG and DSC signals (same atmosphere, flow rate, vapor pressure on the sample, heating rate, thermal contact to the sample crucible and sensor, radiation effect, etc.).
- The analysability of the signals is improved since two or more sets of information concerning sample behaviour are always simultaneously available.
The respective instrument and application standards for TGA and DSC are of course also met by our STA instruments. Simultaneous Thermal Analysis (STA) generally refers to the simultaneous application of Thermogravimetry (TGA) and Differential Scanning Calorimetry (DSC) to one and the same sample in a single instrument.
Our complete range includes:
- Our STA 449 F1 Jupiter® combines unlimited configuration flexibility and unmatched performance in just one instrument.
- The simultaneous thermal analyser, STA 449 F3 Jupiter® allows the measurement of mass changes and thermal effects between -150°C and 2400°C.
- The simultaneous thermal analyser, STA 449 F3 Nevio allows the measurement of mass changes and thermal effects under identical conditions at the same specimen.
- Our STA 449 F5 Jupiter® is a top-loading system with a balanced design that has been preferred for years in laboratories. The reasons are simple: These systems combine ideal performance with easy handling.
- The STA 2500 Regulus features a highly reliable, fully equipped instrument package for STA measurements up to 1600°C at an attractive price.
The advantages are obvious:
The test conditions are perfectly identical for the TGA and DSC signals (same atmosphere, gas flow rate, vapor pressure on the sample, heating rate, thermal contact to the sample crucible and sensor, radiation effect, etc.). Furthermore, sample throughput Is improved as more information can be gathered from each test run.