Spectra 300 TEM

For scientists to advance their understanding of complex samples and develop innovative materials, they must have access to robust, precise instrumentation capable of correlating form and function, as well as resolving space, time, and frequency.

We introduce the Thermo Scientific Spectra 300 (S)TEM – the highest resolution, aberration-corrected, scanning transmission electron microscope for all materials science applications.

Key benefits

  • High energy resolution sources are available on the Spectra 300 (S)TEM.
  • Also configurable with the ultra-high brightness X-CFEG source.
  • Providing the highest resolution STEM imaging performance.
  • Unprecedented sensitivity with the Panther STEM detection system.
  • Advanced STEM imaging capabilities.
  • Spectroscopic flexibility with the Spectra 300 (S)TEM.
  • In situ capabilities of the Spectra 300 (S)TEM.

All Spectra 300 (S) TEMs are delivered on new platforms designed to offer an unprecedented level of mechanical stability and the highest imaging quality through passive and (optional) active vibration isolation.

The system is housed in a fully redesigned enclosure with a built-in on-screen display for convenient specimen loading and removal. For the first time, full modularity and upgradeability can be offered between uncorrected and single-corrected configurations with variable heights, allowing maximum flexibility for different room configurations.

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