Scanning electron microscopy characterization of nanomaterials with sub-nanometer resolution and high material contrast. Our Verios 5 XHR SEM offers subnanometer resolution over the full 1 keV to 30 keV energy range with excellent materials contrast.
Unprecedented levels of automation and ease of use make this performance accessible to users of any experience level.
Key Benefits
- SmartAlign technology eliminates the need for any user alignments of the electron column.
- Improve productivity and minimizes maintenance.
- Elstar Schottky monochromated (UC+) FESEM technology, and performance with sub-nanometer resolution from 1 to 30 keV.
- Low dose operation and optimal contrast selection.
- Innovative electron optics.
- Easy access to beam landing energies.
- With a choice of two precise and stable piezo-driven stages.
- High-resolution nanomaterial imaging with the UC+ monochromated electron source for sub-nanometer performance from 1-30 kV.
- Greatly reduced time to nanoscale information for users with any experience level using the Elstar electron column featuring SmartAlign and FLASH technologies.
- Consistent measurement results with ConstantPower lenses, electrostatic scanning, and a choice of two piezoelectric stages.
- It is flexible for accessories with a large chamber.
- Unattended SEM operation with Thermo Scientific AutoScript 4 Software, an optional Python-based application programming interface.